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                    深圳六碳科技和北京大學化學與分子工程學院鄭俊榮教授合作的用二次諧波表征二維單層薄膜晶疇的文章發表在Optics Letters上。
                    Second-harmonic generation divergence—a method for domain size evaluation of 2D materials。

                    https://www.osapublishing.org/ol/abstract.cfm?uri=ol-46-1-33

                    Abstract:Single-atomic-layered materials are important for future electronics. They allow optoelectronic devices to be fabricated at the single-atomic layer level. A single-atomic-layered two-dimensional (2D) transition metal dichalcogenide (TMD) film is usually composed of randomly orientated single-crystalline domains, and the size distribution of the domains on a large-area film has a significant impact on the applications of the film, but the impact is difficult to characterize. We report an approach to evaluate the size of the single-crystalline domains by measuring the second-harmonic generation divergence caused by the domains of different orientations. Using this method, domain size mapping on an 8×8 mm2 8×8mm2 region of a continuous MoS2 film is achieved. This method provides a fast and efficient way of domain size characterization across a large area in a non-destructive and transfer-free manner for single-atomic-layered TMD films.


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